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laboratories - Electrical Grid and components

Laboratory for the chemical-physical and morphological characterization of materials 

laboratories - Electrical Grid and components

Laboratory for the chemical-physical and morphological characterization of materials 

The laboratory has equipment to analyze materials in different forms, such as powder, thin films and massive samples. This equipment includes:

 

  • Bruker D2 Phaser Diffractometer: used for crystallographic characterization of materials by X-ray diffraction with a copper source. The laboratory also provides instrumentation for identifying crystalline phases and determining cell parameters and relative percentages of phases present in samples. 
  • UV-VIS-NIR Spectrophotometer: used to study the optical properties of materials, especially thin films and powders. The system can measure absorption, transmission and reflectance under various angles of incidence. 
  • Equipment for specific surface area and chemical absorption measurements: used to analyze the specific surface area and chemical adsorption capacity of powdered materials. 
  • Micro-Raman spectroscopy system: used to identify and map the spatial distribution of crystalline phases present in samples. This system is equipped with an electrochemical cell to perform measurements on active materials for storage devices, such as sodium-ion or lithium-ion batteries. It can also be interfaced with a cell for differential scanning calorimetry (DSC) measurements to study phase changes in samples over a temperature range of -190°C to +600°C. 
  • Scanning electron microscope with hot filament source: used for morphological analysis of samples with a magnification of up to approximately 100,000 times. This instrument also allows for compositional analysis by energy-dispersive X-ray spectroscopy (EDX), with an error of about ±1-2% in the determination of elements in samples.