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Capabilities of Grazing Incidence X-ray Diffraction in the Investigation of Amorphous Mixed Oxides with Variable Composition

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Publications - ISI Article

Capabilities of Grazing Incidence X-ray Diffraction in the Investigation of Amorphous Mixed Oxides with Variable Composition

GIXRD is used to study the composition of mixed amorphous oxides. We consider Ta2O5-SiO2 films of interest as anti-reflection coatings. Subsequently, ellipsometry is performed to correlate their optical properties with GIXRD characteristics and hence with composition.

X-ray diffraction has been extensively utilized to study crystalline materials, but very few studies have explored its potential for amorphous materials. Here, we demonstrate the capabilities of Grazing Incidence X-Ray Diffraction in investigating mixed amorphous oxides. We show that the low-angle scattering characteristics exhibit significant variation with composition.

 

This can be quantified using a linear combination of simple functions, constructing calibration curves. As a case study, we consider Ta2O5-SiO2 amorphous films of interest in photovoltaics as anti-reflection coatings. Optical properties were measured using ellipsometry and correlated with the film composition. The results not only highlight a correlation between the diffraction profile and the composition of amorphous films but also reveal a simple and fast strategy to characterize thin amorphous oxides of industrial interest.

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